반도체 웨이퍼 검사용 프로브카드 개발 업체
Contact Force | 1-2.5 gram/mil |
Probe Material | Tungsten |
PCB Size | Customer specified |
Planarity | 18μm |
Probe Depth | Customer specified |
Overdrive | 2~3 mil |
Operating Temp | -25 ~ 100°C |
Tip Alignment | ± 12 μm |
Tip Diameter | 16~22 μm |
Tip Shape | Sharpe |