X-ray Photoelectron Spectroscopy / XPS

Auger Electron Spectroscopy / AES, SAM

Time-of-Flight SIMS / TOF-SIMS

Dynamic SIMS / D-SIMS

Other Systems

Components

Database / Software

X-RAY Source

Ion Source For Sample Cleaning

Electron Energy Analyser CHA

Inverse Photomission IPES

Electron Source For AES

Electron Source For ELS

Spectra Data Acquisition

Multi-channel Detector MCD Upgrade