SAXS, WAXS 시스템
Smart nanoscale characterization
“The Nano-inXider is the tool we needed to complement our existing characterization facilities. It is very easy to use and versatile. The ability to collect the WAXS data simultaneously with the SAXS data is certainly an advantage. The modular features of the instrument allow us to study a wide range of samples, which is a real advantage for multiple users coming with various needs.”
Professor Lam Yeng Ming,
School of Materials Science & Engineering, College of Engineering, Nanyang Technological University, Singapore
Accelerate your research The Nano-inXider gives you answers on the nanostructure of your sample, whether in solid, liquid, gel, powder or thin film. Examples of applications are:
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Discover our application notes :
Overview of a surfactant structure
SAXS measurements of diluted solutions
Size distribution of Gold Nanoparticles
Size distribution of nanoparticles : powders, dispersions and composites
Number concentrations for nanoparticles: robust and traceable measurements in the lab
Directly from samples to result With the Nano-inXider SMART design, just put your sample in the chamber. Then get your results. It is simple and fast. Sample Measurement Analysis Report |
Time-saving The Nano-inXider provides fast answers and straightforward analysis. It is easy to use. Its SMART design ensures a fast learning curve for both scattering experts, material scientists or technicians. With full remote operation capability and auto alignment, the Nano-inXider reduces human errors to the minimum, and guarantees reproducibility as well as measurement traceability. It is ideal for open access labs. |
Accurate and high dynamic range measurement Focus your attention on science and data interpretation, you can rely on your data. The Nano-inXider acquires high signal to noise data by measuring the intense direct beam transmitted through the sample together with low intensity signal scattered from the sample. The high dynamic range of intensity collection directly impacts data quality by:
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Simultaneously from atomic to nanoscale No need to repeat SAXS and WAXS measurement, you get two measurements within one exposure. The Nano-inXider features a smart dual detector design to detect atomic scale information and nanostructure simultaneously within one exposure. Long sample-to-detector distance for measuring large characteristic dimensions is achieved in SAXS through a vertical design with a small footprint. Such configuration provides unique benefits:
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Low cost of ownership Get nanoscale information on a day to day basis to improve your material process or validate your research models.
The low cost of ownership of the Nano-inXider mainly comes from its compactness and low cost of operation. |