Probe card for inspecting Semi conductor wafer
Contact Force | 1 gram/mil (Stable contact force) |
Probe Material, Tip Material | Nickel-Cobalt, Rhodium (Long life time) |
PCB Size | 440mm (480mm) |
Planarity | ± 4 μm |
Contact resistance | ~ 1.5 Ohm |
Overdrive | ~ 4 mil |
Operating Temp | -25 ~ 100°C |
Tip Alignment | ± 4 μm |
Tip Diameter | 10 μm ± 2 μm |
Tip Shape | Circular column |
Contact Force | 1.0 gram/mil |
Probe Material, Tip Material | Nickel-Cobalt (Body), Rhodium (Tip) |
PCB Size | 440mm or 480mm |
Max Test Size | 100mm X 100mm |
Planarity | ± 4 μm |
Contact resistance | 2 ~ 3 Ohm |
Overdrive | 4 mil |
Operating Temp | -20°C ~ 85°C |
X.Y Position | ± 4 μm |
Tip Diameter | 10 μm ± 2 μm |
Tip Shape | Circular cone |
Contact Force | 1.0 gram/mil |
Probe Material, Tip Material | Nickel-Cobalt (Body), Rhodium (Tip) |
PCB Size | 440mm or 480mm |
Max Test Size | 100mm X 100mm |
Planarity | ± 4 μm |
Contact resistance | 2 ~ 3 Ohm |
Overdrive | 4 mil |
Operating Temp | -20°C ~ 85°C |
X.Y Position | ± 4 μm |
Tip Diameter | 10 μm ± 2 μm |
Tip Shape | Round Bar |
Contact Force | 0.5 gram/mil, 0.7 gram/mil, 1.0 gram/mil |
Probe Material, Tip Material | Nickel-Cobalt (Body), Rhodium (Tip) |
PCB Size | 480mm |
Max Test Size | 12 Inch |
Planarity | ± 12.5 μm |
Contact resistance | 2 ~ 3 Ohm |
Overdrive | 4 mil |
Operating Temp | -20°C ~ 100°C |
X.Y Position | ± 12 μm |
Tip Diameter | 5 μm x 10 μm ± 2 μm |
Tip Shape | Round Bar |