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Cantilever Probe Card for LSI (ASIC)
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Series
LSI Products
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Korea Instrument

Probe card for inspecting Semi conductor wafer

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Manufacturer
Korea Instrument
Brand
-
SKU
49478
Product Name
Cantilever Probe Card for LSI (ASIC)
Model Name
-
Size
-
Weight
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Product Details

Korea Instrument Cantilever Probe Card for LSI (ASIC)

Korea Instrument
Probe card for inspecting Semi conductor wafer
Our company has been able to grown in the last 10 years and we have been able to overcome the challenges by providing customers with stable supply of reliable components through innovation and strong work ethics and we are transforming from a small and medium sized company to a mid-sized company status this year. The stable growth could not have been possible without the trust of the employees and stock holders and continued transparent interaction with suppliers and customers alike and the incessant endeavor towards achieving the company vision. We will further strive and devote ourselves to be the company that customers would like to work with, where employees want to work at and that the locals respect.
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