Semi conductor inspection system manufacturer, Inspection equipment, Measuring equipment, SMT, Wafer, FPP panel
Green Sheet Via Fill Inspection System is an optical vision inspection system intended for total inspection on via filling state printed on ceramic green sheet. The advantage of 3D USCAN is that it uses 3D measurement principles to perform inspection using 3D height map created based on high precision measurement of via filling height, detecting quality defects caused by changes in filling height which are difficult to defect using existing inspection systems