Electronic microscope, Electron beam welding machine, Scanning electron microscope, Electron beam, FE-SEM and more
LaB₆ SEM
(PREMIUM NORMAL SEM)
Product Description : AIS2500C is equipped with LaB₆ cathode to increase the resolution of tungsten hair-pin filament SEM, thus having an advantage in the observation of surface images at high magnification. AIS2500C has increased durability by using mu-metal material, a special alloy, in the shielding treatment to minimize magnetization, and the self-designed 60-degree conical objective lens allows easy observation of large-area samples in high-magnification and high-resolution images at short working distances while moving widely. In addition, it satisfies the physical compatibility required by various analysis devices such as EDS and WDS, thereby taking advantage of achieving a maximum resolving power.
Patents and Certifications : CE Certificates
Features
A premium normal SEM equipped with LaB₆ tip and 60˚ conical lens, which offers the highest resolving power available in Korea
1) 60-degree conical lens (for observation of large-area samples)
2) High-resolution imaging (High pixel resolution)
3) High-speed scanning control driver
4) Multitasking window
5) High-capacity data storage and filing through auto-stepping and tiling
6) Powerful image processing, built-in analysis and measurement software/h6>
Specifications
| ELECTRON OPTIC SYSTEM | |||
| Electron Gun Source | LaB₆ Filament Cathode | Magnification | 10X ~ 300,000X |
| Resolution | 2.5nm@30keV SE/3nm@BSE | Vacuum | ~10-7 Torr with Ion Pump |
| Accelerating Voltage | 0.2kV ~ 30kV | Stage | 5-Axis Stage (Various Options) |
| Image ShiftImage Shift | 330 / 325μm(X/Y), Image Rotation(360°) | Option | IR CCD, BSE EDS, EBSD, WDS 외 |