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PREMIUM LaB₆
Model Name
LaB₆ SEM
Series
PREMIUM LaB₆
Data
-
Manufacturer information
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Saeron TechnologyElectronic microscope, Electron beam welding machine, Scanning electron microscope, Electron beam, FE-SEM and more
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Manufacturer
Saeron Technology
Brand
-
SKU
142763
Product Name
PREMIUM LaB₆
Model Name
LaB₆ SEM
Size
-
Weight
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Product Details

LaB₆ SEM
(PREMIUM NORMAL SEM)

Product Description : AIS2500C is equipped with LaB₆ cathode to increase the resolution of tungsten hair-pin filament SEM, thus having an advantage in the observation of surface images at high magnification. AIS2500C has increased durability by using mu-metal material, a special alloy, in the shielding treatment to minimize magnetization, and the self-designed 60-degree conical objective lens allows easy observation of large-area samples in high-magnification and high-resolution images at short working distances while moving widely. In addition, it satisfies the physical compatibility required by various analysis devices such as EDS and WDS, thereby taking advantage of achieving a maximum resolving power.

Patents and Certifications : CE Certificates

 

Features

A premium normal SEM equipped with LaB₆ tip and 60˚ conical lens, which offers the highest resolving power available in Korea

1) 60-degree conical lens (for observation of large-area samples)
2) High-resolution imaging (High pixel resolution)
3) High-speed scanning control driver
4) Multitasking window
5) High-capacity data storage and filing through auto-stepping and tiling
6) Powerful image processing, built-in analysis and measurement software/h6>

 

 

Specifications

ELECTRON OPTIC SYSTEM
Electron Gun Source LaB₆ Filament Cathode Magnification 10X ~ 300,000X
Resolution 2.5nm@30keV SE/3nm@BSE Vacuum ~10-7 Torr with Ion Pump
Accelerating Voltage 0.2kV ~ 30kV Stage 5-Axis Stage (Various Options)
Image ShiftImage Shift 330 / 325μm(X/Y), Image Rotation(360°) Option IR CCD, BSE EDS, EBSD, WDS 외
Saeron TechnologyElectronic microscope, Electron beam welding machine, Scanning electron microscope, Electron beam, FE-SEM and more
Korea's representative electron beam band that leads the nation's technology. Starting with the successful localization of the scanning electron microscope (SEM) in 2001 for the first time in Korea, Seron Technologies Inc. has been recognized for its technological prowess by contributing to the advancement of Korean science and technology and industries such as nano-materials, semiconductors, chemicals, and textiles. Based on the exclusive electron beam optic design technology accumulated over the years, it is providing top-notch electron microscope products in Korea and customization services to fulfill the various needs of customers. In addition, we are launching a variety of models from low-end to high-end for differentiation against low-cost products produced by latecomers in the domestic market that are oriented toward price competitiveness and to compete with global competitors with advanced technology. Going forward, we will continue to strive to provide optimal products and exclusive application solutions for customer satisfaction and fulfillment, while securing technological competitiveness in relentless pursuit of the development of next-generation advanced technology to achieve global brand status.
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