Electronic microscope, Electron beam welding machine, Scanning electron microscope, Electron beam, FE-SEM and more
SEMIRON 5000
Product Description : SEMIRON 5000 provides high-resolution images by overcoming the limitations of existing normal SEMs, which gives it a great advantage in the observation of surfaces. In addition, the 60-degree objective lens enables the mounting and movement of large-area samples freely even at short working distances, while ensuring high-magnification and clear images, and achieving optimum performance when installing EDS and WDS analyzers. This can greatly reduce the burden of maintenance and repair compared to using foreign-imported FE-SEMs and will bring great benefits to Korea’s advanced technology development.
FE-SEM SEMIRON5000
This schottky-type FE-SEM based on self-develope electron optic
design technology is a result of steady technology investment and passion.
- 1,000,000X
Clear image realization - Easy mounting and movement of various component analysis equipment
- Equipped with OCD camera
(Easy to mount, move, and observe large-area samples)
Features
FE-SEM is produced using an exclusive technology!
1) 60-degree conical O.L lens (for observation of large-area samples)
2) High-resolution imaging (Ultra-high pixel resolution)
3) High-speed scanning control driver
4) Multitasking window
5) High-capacity data storage and filing through auto-stepping
6) Equipped with various image noise filters and measurement software
7) Powerful image processing and image analysis software package
Specifications
| ELECTRON OPTIC SYSTEM | |||
| Electron Gun Source | Schottky FE-Tip | Resolution | 약 1.5nm@30keV SE |
| Magnification | 10X ~ 1,000,000X | Accelerating Voltage | ~30kV(Continuous Voltage Change) |
| Operating System | Multi Tasking GUI Multi-Channel Window |
Option | BSE, EDS, WDS, EBSD, EBI, Sub-Chamber, Peltier Stage, Tensile Tester etc. |